SENSITIVITY VARIATIONS IN BAYARD-ALPERT GAUGES CAUSED BY AUGER EMISSION AT COLLECTOR

被引:7
作者
GOPALARAMAN, CP
ARMSTRON.RA
REDHEAD, PA
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1970年 / 7卷 / 01期
关键词
D O I
10.1116/1.1315793
中图分类号
O59 [应用物理学];
学科分类号
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页码:195 / +
页数:1
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