PHOTOCURRENT SPECTROSCOPY IN THIN-FILM INSULATORS - VOLTAGE DEPENDENCE OF EXTERNAL-CIRCUIT CURRENT

被引:23
作者
DIMARIA, DJ
FEIGL, FJ
机构
[1] LEHIGH UNIV,MAT RES CTR,BETHLEHEM,PA 18015
[2] LEHIGH UNIV,DEPT PHYS,BETHLEHEM,PA 18015
来源
PHYSICAL REVIEW B | 1974年 / 9卷 / 04期
关键词
D O I
10.1103/PhysRevB.9.1874
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1874 / 1883
页数:10
相关论文
共 24 条
[1]  
ARIS FC, 1972, FAL EL SOC M
[2]   LIMITATIONS UPON PHOTOINJECTION STUDIES OF CHARGE DISTRIBUTIONS CLOSE TO INTERFACES IN MOS CAPACITORS [J].
BREWS, JR .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (01) :379-384
[3]  
BRODRIBB JD, 1972, FAL EL SOC M
[4]  
BUBE RH, 1960, PHOTOCONDUCTIVITY SO, pCH9
[5]  
BUBE RH, 1960, PHOTOCONDUCTIVITY SO, pCH10
[6]   PHOTOEMISSION OF ELECTRONS FROM SILICON AND GOLD INTO SILICON DIOXIDE [J].
GOODMAN, AM .
PHYSICAL REVIEW, 1966, 144 (02) :588-&
[7]  
Grove A. S., 1967, PHYS TECHNOL S
[8]  
GROVE AS, 1967, PHYS TECHNOL S, pCH12
[9]  
GROVE AS, 1967, PHYS TECHNOL S, pCH9
[10]   TRAP STRUCTURE OF PYROLYTIC AL2O3 IN MOS CAPACITORS [J].
HARARI, E ;
ROYCE, BSH .
APPLIED PHYSICS LETTERS, 1973, 22 (03) :106-107