The effect of deposition parameters on optoelectronic and structural properties of ZnO based thin films prepared by RF magnetron sputtering have been studied. Different targets (pure Zn. ZnO, Zn-Al (98/2 at%), ZnO-Al (98/2 at%), and ZnO-Al2O3 (98/2 wt%)) have been investigated to compare resulting samples and establish the best target composition. From reactive sputtering, using a Zn-Al target, transparent conductive zinc oxide has been obtained at 380-degrees-C with E(g) = 3.25-3.35 eV and rho = 4.8 X 10(-4) OMEGA cm. Reduction of substrate temperature at 200-degrees-C has been possible by nonreactive sputtering from ZnO-Al and ZnO-Al2O3 targets. The values of the energy gap and resistivity under these conditions are 3.30-3.35 eV and 1 X 10(-3) OMEGA cm respectively.