ATOMIC EMISSION AND ATOMIC-ABSORPTION SPECTROMETRIC ANALYSIS OF HIGH-PURITY POWDERS FOR THE PRODUCTION OF CERAMICS

被引：86

作者：

GRAULE, T

VONBOHLEN, A

BROEKAERT, JAC

GRALLATH, E

KLOCKENKAMPER, R

TSCHOPEL, P

TOLG, G

机构：

[1] MAX PLANCK INST MET RES,REINSTSTOFFANALYT LAB,BUNSEN KIRCHHOFF STR 13,D-4600 DORTMUND 1,FED REP GER

[2] INST SPEKTROCHEM & ANGEW SPEKT,D-4600 DORTMUND 1,FED REP GER

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1989年 / 335卷 / 07期

关键词：

D O I：

10.1007/BF01204062

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：637 / 642

页数：6

共 17 条

[1] ANALYSIS OF ADVANCED CERAMICS AND THEIR BASIC PRODUCTS
BROEKAERT, JAC
GRAULE, T
JENETT, H
TOLG, G
TSCHOPEL, P
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 332 (08): : 825 - 838
[2] A MICROCOMPUTER-CONTROLLED DUAL-CHANNEL MONOCHROMATOR FOR PLASMA ATOMIC EMISSION-SPECTROMETRY WITH TIME-CONSTANT AND TRANSIENT SIGNALS
BROEKAERT, JAC
HAGENAH, WD
LAQUA, K
LEIS, F
STUWER, D
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1986, 41 (12) : 1357 - 1365
[3] DOECKAL B, IN PRESS
[4] DIRECT ATOMIC SPECTROMETRIC ANALYSIS BY SLURRY ATOMIZATION .3. WHOLE COAL ANALYSIS BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY
EBDON, L
WILKINSON, JR
[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1987, 2 (03) : 325 - 328
[5] DIRECT ATOMIC SPECTROMETRIC ANALYSIS BY SLURRY ATOMIZATION .5. ANALYSIS OF KAOLIN USING INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY
EBDON, L
COLLIER, AR
[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1988, 3 (04) : 557 - 561
[6] A STUDY OF PNEUMATIC NEBULIZATION SYSTEMS FOR INDUCTIVELY COUPLED PLASMA EMISSION-SPECTROMETRY
EBDON, L
CAVE, MR
[J]. ANALYST, 1982, 107 (1271) : 172 - 178
[7] GRAULE T, 1988, THESIS DORTMUND
[8] NEBULIZATION OF SLURRIES AND SUSPENSIONS OF GEOLOGICAL-MATERIALS FOR INDUCTIVELY COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY
HALICZ, L
BRENNER, IB
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1987, 42 (1-2) : 207 - 217
[9] DETERMINATION OF THE CRITICAL THICKNESS AND THE SENSITIVITY FOR THIN-FILM ANALYSIS BY TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
KLOCKENKAMPER, R
VONBOHLEN, A
[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) : 461 - 469
[10] KUDERMANN G, 1984, FORTSCHRITTE ATOMSPE, P211

← 1 2 →