TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR SURFACE-ANALYSIS

被引:38
作者
KNOTH, J
SCHWENKE, H
WEISBROD, U
机构
关键词
D O I
10.1016/0584-8547(89)80053-9
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:477 / 481
页数:5
相关论文
共 5 条
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Compton A.H., 1935, XRAYS THEORY EXPT
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EICHINGER P, 1988, ASTM STP, V990
[3]   SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].
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PHYSICAL REVIEW, 1954, 95 (02) :359-369
[4]   APPLICATION OF TOTAL REFLECTION X-RAY-FLUORESCENCE IN SEMICONDUCTOR SURFACE-ANALYSIS [J].
PENKA, V ;
HUB, W .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) :483-490
[5]  
SCHWENKE H, UNPUB HDB XRAY SPECT