STUDY OF VERY THIN SURFACE-LAYERS BY MEANS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (DCEMS)

被引：19

作者：

BELOZERSKII, GN ^{[1
]}

BOHM, C ^{[1
]}

EKDAHL, T ^{[1
]}

LILJEQUIST, D ^{[1
]}

机构：

[1] UNIV STOCKHOLM,DEPT PHYS,S-11346 STOCKHOLM,SWEDEN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 192卷 / 2-3期

关键词：

D O I：

10.1016/0029-554X(82)90870-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：539 / 543

页数：5

共 17 条

[1] ELECTROSTATIC SPECTROMETER FOR CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY
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BODLUNDRINGSTROM, B
BOHM, C
EKDAHL, T
LILJEQUIST, D
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 154 (02): : 401 - 403
[2] BAVERSTAM U, 1974, MOSSBAUER EFFECT MET, V9, P259
[3] BAVERSTAM U, USIP7413 REP
[4] BELOZERSKII G, UNPUB
[5] BELOZERSKII G, 1980, 179TH P S REC CHEM A
[6] DEPTH SELECTIVE CEMS APPLIED TO THE EXAMINATION OF THE CONDITIONS IN VACUUM-SYSTEMS
BODLUNDRINGSTROM, B
BAVERSTAM, U
BOHM, C
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (04): : 1013 - 1016
[7] DEPTH SELECTIVE MOSSBAUER-SPECTROSCOPY .2. INFLUENCE OF THE ATOMIC NUMBER OF THE INERT COMPONENT IN THE SURFACE-LAYER
BONCHEV, T
GROZDANOV, M
STOEV, L
[J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 165 (02): : 237 - 241
[8] METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT
BONCHEV, Z
JORDANOV, A
MINKOVA, A
[J]. NUCLEAR INSTRUMENTS & METHODS, 1969, 70 (01): : 36 - &
[9] EKDAHL T, USIP7411 REP
[10] INTERACTIVE METHODS OF ANALYSIS IN DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (DCEMS)
LILJEQUIST, D
BOHM, C
EKDAHL, T
[J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 177 (2-3): : 495 - 497