ELECTRIC-FIELD DISTRIBUTION MEASUREMENT OF MICROSTRIP ANTENNAS AND ARRAYS USING ELECTROOPTIC SAMPLING

被引:13
作者
IMAIZUMI, Y [1 ]
SHINAGAWA, M [1 ]
OGAWA, H [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, LSI LABS, ATSUGI, KANAGAWA 24301, JAPAN
关键词
D O I
10.1109/22.414595
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes an electric field distribution measurement method for microwave integrated circuit arrays that uses Electro-optic sampling (EOS). The electric fields of a microstrip patch antenna are measured by EOS and compared with the theoretical results calculated by the spectral domain approach. Good agreement between measurement and theory is found. An array antenna composed of two microstrip patches is also assessed by the EOS method and the expected results are experimentally verified, The EOS proposed in this paper is promising to evaluate the electric field distribution of individual antenna elements in large scaled integrated array antennas.
引用
收藏
页码:2402 / 2407
页数:6
相关论文
共 11 条
[1]  
DAVID G, 1994, OCT AS PAC MICR C P, P149
[2]  
Frankel M. Y., 1991, IEEE Microwave and Guided Wave Letters, V1, P60, DOI 10.1109/75.80723
[3]   CHARACTERIZATION OF A MONOLITHIC SLOT ANTENNA USING AN ELECTROOPTIC SAMPLING TECHNIQUE [J].
KAMOGAWA, KJ ;
TOYODA, I ;
NISHIKAWA, K ;
TOKUMITSU, T .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1994, 4 (12) :414-416
[4]   PROPAGATION CHARACTERISTICS OF STRIPLINES WITH MULTILAYERED ANISOTROPIC MEDIA [J].
KITAZAWA, T ;
HAYASHI, Y .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1983, 31 (06) :429-433
[5]   AN INVESTIGATION OF STRIPLINES AND FIN LINES WITH PERIODIC STUBS [J].
KITAZAWA, T ;
MITTRA, R .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1984, 32 (07) :684-688
[6]  
NAGATSUMA T, 1994, NOV P INT IEEE MTT S, P7
[7]  
RILEY AL, 1991 IEEE MICR MILL, P11
[8]   A LASER-DIODE-BASED PICOSECOND ELECTROOPTIC PROBER FOR HIGH-SPEED LSIS [J].
SHINAGAWA, M ;
NAGATSUMA, T .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (03) :375-380
[9]  
SHINAGAWA M, 1992, SEP P INT TEST C, P834
[10]   PICOSECOND ELECTROOPTIC SAMPLING SYSTEM [J].
VALDMANIS, JA ;
MOUROU, G ;
GABEL, CW .
APPLIED PHYSICS LETTERS, 1982, 41 (03) :211-212