CHARACTERIZATION AND COMPARISON OF AUGER-ELECTRON SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION OF MONO-CRYSTALLINE, AMORPHOUS AND HYDROGENATED SILICON

被引：8

作者：

ALLIE, G ^{[1
]}

LAUROZ, C ^{[1
]}

CHENEVASPAULE, A ^{[1
]}

机构：

[1] CEN,CEA,ELECTRO & TECHNOL INFORMAT LAB,NCE,F-38041 GRENOBLE,FRANCE

来源：

关键词：

D O I：

10.1016/0378-5963(80)90131-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：221 / 233

页数：13

共 18 条

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