REMEASUREMENT OF THE CUK-ALPHA-1 EMISSION X-RAY WAVELENGTH IN THE METRICAL SYSTEM (PRESENT STAGE)

被引：36

作者：

HARTWIG, J

GROSSWIG, S

BECKER, P

WINDISCH, D

机构：

[1] INST PHYS ERDE,O-6900 JENA,GERMANY

[2] PHYS TECH BUNDESANSTALT,ATOMPHYS ABT,W-3300 BRAUNSCHWEIG,GERMANY

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1991年 / 125卷 / 01期

关键词：

D O I：

10.1002/pssa.2211250105

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Using a crystal which lattice parameter is measured firstly with simultaneous X-ray and optical interferometry in the metrical system and secondly with a diffractometric measurement with respect to the X-ray line the wavelength of the characteristic CuK-alpha-1 emission line is remeasured with an accuracy, DELTA-lambda/lambda, of about 3 x 10(-7) in the metrical system.

引用

页码：79 / 89

页数：11

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