ON CORRELATING TEM CELL AND OATS EMISSION MEASUREMENTS

被引:139
作者
WILSON, P
机构
关键词
D O I
10.1109/15.350235
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The use of single-port broad-band TEM cells for both near-field and far-field radiated emission testing is considered, The approach is to model the radiation from the device under test (DUT) as due to an equivalent set of multipoles. Assuming the DUT is electrically small only the initial multipole moments, the electric and magnetic dipole terms, need be retained, A sequence of TEM cell measurements is then used to determine the equivalent DUT dipole moments, The dipole model then allows one to simulate DUT emissions both in free space and over a ground screen, Thus, emission measurements over an open area test site (OATS) as called for by various standards may be simulated, Such measurement schemes have previously been successfully developed for standard two port TEM cells. However, certain broad band TEM cells are single-port devices; thus, some modification of the previous approach is required, This paper reviews the basics of the multipole model as it relates to TEM cells, details various measurement schemes appropriate to single port TEM cells, and presents examples of measured emission data, both near field and far field, In all cases considered, the correlation between emission data measured directly over a ground screen and simulated ground screen data based on TEM. cell measurements is excellent.
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页码:1 / 16
页数:16
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