CAPACITANCE VOLTAGE ANALYSIS AND CURRENT MODELING OF PULSE-DOPED MODFETS

被引:12
作者
ROBLIN, P
ROHDIN, H
HUNG, CJ
CHIU, SW
机构
[1] MOTOROLA INC,AUSTIN,TX 75252
[2] HEWLETT PACKARD CO,PALO ALTO,CA 94304
关键词
D O I
10.1109/16.43659
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2394 / 2404
页数:11
相关论文
共 34 条
[21]   TEMPERATURE DEPENDENCE OF TRANSPORT PROPERTIES OF GALLIUM ARSENIDE DETERMINED BY A MONTE-CARLO METHOD [J].
RUCH, JG ;
FAWCETT, W .
JOURNAL OF APPLIED PHYSICS, 1970, 41 (09) :3843-&
[22]   TRANSPORT PROPERTIES OF GAAS [J].
RUCH, JG ;
KINO, GS .
PHYSICAL REVIEW, 1968, 174 (03) :921-+
[23]   A TREATISE ON THE CAPACITANCE-VOLTAGE RELATION OF HIGH ELECTRON-MOBILITY TRANSISTORS [J].
SADWICK, LP ;
WANG, KL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (05) :651-656
[24]   SHALLOW AND DEEP DONORS IN DIRECT-GAP N-TYPE ALXGA1-XAS-SI GROWN BY MOLECULAR-BEAM EPITAXY [J].
SCHUBERT, EF ;
PLOOG, K .
PHYSICAL REVIEW B, 1984, 30 (12) :7021-7029
[25]   ELECTRON-ENERGY LEVELS IN GAAS-GA1-XALXAS HETEROJUNCTIONS [J].
STERN, F ;
DASSARMA, S .
PHYSICAL REVIEW B, 1984, 30 (02) :840-848
[26]  
SUBRAMANIAN S, 1986, IEEE T ELECTRON DEV, V3, P707
[27]  
SZE SM, 1981, PHYSICS SEMICONDUCTO
[28]  
TU C, 1985, GALLIUM ARSENIDE TEC
[30]  
WANG TF, COMMUNICATION