SURFACE-STRUCTURE DETERMINATION WITH FORWARD FOCUSED ELECTRONS

被引：119

作者：

XU, ML

VANHOVE, MA

机构：

来源：

SURFACE SCIENCE | 1989年 / 207卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(89)90121-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：215 / 232

页数：18

共 22 条

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[5] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION
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[7] QUANTITATIVE CHARACTERIZATION OF ABRUPT INTERFACES BY ANGLE-RESOLVED AUGER-ELECTRON EMISSION
CHAMBERS, SA
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SMITH, CP
WEAVER, JH
[J]. PHYSICAL REVIEW B, 1985, 32 (06): : 4245 - 4248
[8] ATOMIC-STRUCTURE OF THE CU/SI(111) INTERFACE BY HIGH-ENERGY CORE-LEVEL AUGER-ELECTRON DIFFRACTION
CHAMBERS, SA
ANDERSON, SB
WEAVER, JH
[J]. PHYSICAL REVIEW B, 1985, 32 (02): : 581 - 587
[9] DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001)
CHAMBERS, SA
CHEN, HW
VITOMIROV, IM
ANDERSON, SB
WEAVER, JH
[J]. PHYSICAL REVIEW B, 1986, 33 (12): : 8810 - 8813
[10] CRONACHER H, IN PRESS SURFACE SCI

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