CAPACITANCE-BASED MICROPOSITIONING SYSTEM FOR X-RAY ROCKING CURVE MEASUREMENTS

Certain types of x-ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long-term angular stability of ∼10-7 radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long-term overall angular stability.