HIGH-RESOLUTION X-RAY SPECTROMETER FOR PIXE WORK

被引：14

作者：

FOLKMANN, F

FREDERIKSEN, F

机构：

[1] Institute of Physics, University of Aarhus

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 49卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90228-M

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A spectrometer is described with a curved Si(111) crystal and a position-sensitive detector set up in fixed geometry to measure X-rays of energy 3.5 ± 0.28 keV with a resolution of 6 eV. The position result, obtained by division, is processed like an energy into a multichannel system. Positioning the target area significantly closer to the crystal than the detector assures that areas extending over several mm produce similar results. The efficiency is only a few counts per μC per μg/cm2. © 1990.

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页码：126 / 131

页数：6

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