RAPID MEASUREMENT OF SINGLE-CRYSTAL DIFFRACTION INTENSITIES

被引：11

作者：

BASSI, GC

机构：

[1] CEN,DEPT RECH FONDAMENTALE,GRENOBLE,FRANCE

[2] CNRS,LAB RAYONS X,BP 166,38042 GRENOBLE,FRANCE

来源：

关键词：

D O I：

10.1107/S002188987300868X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：280 / 284

页数：5

共 7 条

[1] SINGLE-CRYSTAL DIFFRACTOMETRY - IMPROVEMENT OF ACCURACY IN INTENSITY MEASUREMENTS
ALEXANDER, LE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1964, 17 (10): : 1195 - &
[2] SINGLE-CRYSTAL INTENSITY MEASUREMENTS WITH 3-CIRCLE COUNTER DIFFRACTOMETER
ALEXANDER, LE
SMITH, GS
[J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (OCT): : 983 - &
[3] ALGORITHMIC LANGUAGE FOR INTENSITY MEASUREMENT
BASSI, GC
GUITEL, JC
GEYNET, M
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1972, 5 (JUN1) : 230 - &
[4] SIMULTANEOUS DIFFRACTION - INDEXING UMWEGANREGUNG PEAKS IN SIMPLE CASES
COLE, H
CHAMBERS, FW
DUNN, HM
[J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (FEB): : 138 - &
[5] LADELL J, 1969, ACTA CRYST, V12, P561
[6] Masse R., 1972, CRYST STRUCT COMMUN, V1, P239
[7] VICAT J, TO BE PUBLISHED