ADAPTATION OF MULTILAYER FORMALISM TO THE SOLUTION OF TEMPERATURE-DEPENDENT X-RAY-DIFFRACTION IN CRYSTALS

被引：2

作者：

GOLDSTEIN, WH ^{[1
]}

HAILEY, CJ ^{[1
]}

LUPTON, JH ^{[1
]}

机构：

[1] KMS FUS INC,ANN ARBOR,MI 48106

来源：

OPTICS COMMUNICATIONS | 1987年 / 62卷 / 04期

关键词：

MULTILAYER CRYSTAL MODELLING - STRAINED/HEATED CRYSTALS - X-RAY REFLECTIVITY;

D O I：

10.1016/0030-4018(87)90169-6

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：259 / 264

页数：6

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