STUDY OF FILMS HAVING BASE OF TIN OXIDE AND INDIUM OXIDE BY MEANS OF X-RAY-DIFFRACTION

被引：40

作者：

HECQ, M ^{[1
]}

DUBOIS, A ^{[1
]}

VANCAKEN.J ^{[1
]}

机构：

[1] UNIV ETAT MONS,LAB CHIM INORG,7000 MONS,BELGIUM

来源：

THIN SOLID FILMS | 1973年 / 18卷 / 01期

关键词：

D O I：

10.1016/0040-6090(73)90229-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：117 / 125

页数：9

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