A COMPARISON OF EXPERIMENTAL AND THEORETICALLY DERIVED SENSITIVITY FACTORS FOR XPS

被引：68

作者：

WARD, RJ ^{[1
]}

WOOD, BJ ^{[1
]}

机构：

[1] UNIV QUEENSLAND,DEPT CHEM,ST LUCIA,QLD 4072,AUSTRALIA

来源：

SURFACE AND INTERFACE ANALYSIS | 1992年 / 18卷 / 09期

关键词：

D O I：

10.1002/sia.740180908

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy sensitivity factors for elements from lithium to zinc have been determined experimentally using standard compounds. These are found to differ quite considerably from those theoretically calculated using Scofield's photoelectric cross-sections, but are in good agreement with other experimentally derived databases in the literature. It is concluded that Scofield's cross-sections are in error and that a correction factor must be employed if they are to be used for the calculation of XPS sensitivity factors.

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页码：679 / 684

页数：6

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