AN S-SHAPED SOFTWARE-RELIABILITY GROWTH-MODEL WITH 2 TYPES OF ERRORS

被引：14

作者：

KAREER, N ^{[1
]}

KAPUR, PK ^{[1
]}

GROVER, PS ^{[1
]}

机构：

[1] UNIV DELHI,DEPT OPERAT RES,DELHI 110007,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1990年 / 30卷 / 06期

关键词：

D O I：

10.1016/0026-2714(90)90285-U

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An S-shaped software reliability growth model (SRGM) based on a non-homogeneous Poisson process (NHPP) with two types of errors has been proposed. The errors have been classified depending upon their severity. We have estimated the model parameters and obtained the optimum release policies which minimize the cost subject to achieving a given level of reliability. Numerical results illustrating the applicability of the proposed model are also presented.

引用

页码：1085 / 1090

页数：6

共 10 条

[1]

CONTE, 1986, SOFTWARE ENG METRICS

[2] TIME-DEPENDENT ERROR-DETECTION RATE MODEL FOR SOFTWARE RELIABILITY AND OTHER PERFORMANCE-MEASURES [J].