CALIBRATION OF A COMMERCIAL ELECTRON-MICROSCOPE WITH A GRATING REPLICA TO AN ACCURACY OF BETTER THAN 1-PERCENT

被引：10

作者：

BROWN, LM

机构：

来源：

关键词：

D O I：

10.1111/j.1365-2818.1978.tb02458.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：149 / 160

页数：12

共 11 条

[1]

AGAR AW, 1974, PRINCIPLES PRACTICE

[2]

BAHR GF, 1965, LAB INVEST, V14, P880

[3]

BROWN LM, 1975, THESIS U LONDON, P289

[4]

BROWN LM, 1976, 6TH P EUR C EL MICR, V1, P372

[5]

ELBERS PF, 1963, J ULTRASTRUCT RES, V11, P25

[6]

HALL CE, 1966, INTRO ELECTRON MICRO

[7]

HECKMAN FA, 1962, 5TH P INT C EL MICR

LODDER, JC ;

BERG, KGVD .

JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (JAN) :93-98

[9]

OSTER CF, 1962, 5TH P INT C EL MICR

[10]

REISNER JH, 1965, LAB INVEST, V14, P875