ROCKING-BEAM FORCE-BALANCE APPROACH TO ATOMIC FORCE MICROSCOPY

被引：15

作者：

GRIGG, DA ^{[1
]}

RUSSELL, PE ^{[1
]}

GRIFFITH, JE ^{[1
]}

机构：

[1] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

关键词：

D O I：

10.1016/0304-3991(92)90473-W

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We report on the use of a force-balance atomic force microscope to obtain images with nanometer-scale resolution. In addition, force curve measurements were obtained on a mica surface in air with a sensitivity of 10(-8) N.

引用

页码：1504 / 1508

页数：5

共 7 条

[1] FORCE MEASUREMENT USING AN AC ATOMIC FORCE MICROSCOPE [J].

DUCKER, WA ;

COOK, RF ;

CLARKE, DR .

JOURNAL OF APPLIED PHYSICS, 1990, 67 (09) :4045-4052

[2]

GRIGG DA, 1992, ULTRAMICROSCOPY, V42, P1615

[3] A NEW FORCE SENSOR INCORPORATING FORCE-FEEDBACK CONTROL FOR INTERFACIAL FORCE MICROSCOPY [J].

JOYCE, SA ;

HOUSTON, JE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03) :710-715

[4]

MILLER GH, COMMUNICATION

[5] RESONANT PHASE-SHIFT TECHNIQUE FOR THE MEASUREMENT OF SMALL CHANGES IN GROUNDED CAPACITORS [J].

MILLER, GL ;

WAGNER, ER ;

SLEATOR, T .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (04) :1267-1272

[6] A ROCKING BEAM ELECTROSTATIC BALANCE FOR THE MEASUREMENT OF SMALL FORCES [J].

MILLER, GL ;

GRIFFITH, JE ;

WAGNER, ER ;

GRIGG, DA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03) :705-709

[7] SCANNING PROBE TIPS FORMED BY FOCUSED ION-BEAMS [J].

VASILE, MJ ;

GRIGG, DA ;

GRIFFITH, JE ;

FITZGERALD, EA ;

RUSSELL, PE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (09) :2167-2171

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