COMPARISON BETWEEN ATOMIC-FORCE MICROSCOPIC IMAGES OF IONIC-CRYSTAL SURFACES IN AIR AND IN DRY ARGON

被引：13

作者：

MIURA, K

SHUKUYA, Y

机构：

[1] Department of Physics, Aichi University of Education, Igaya-cho Kariya, Aichi

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 10期

关键词：

AFM; IONIC CRYSTAL; SURFACE ATOMIC STRUCTURE; WATER; BOND STRENGTH; STATIC FRICTIONAL FORCE;

D O I：

10.1143/JJAP.32.4752

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have observed cleavage surfaces of ionic crystals in air and in dry argon using atomic force microscopy (AFM). AFM images from cleavage surfaces of NaCl, KCl, LiF, CaF2 and BaF2 clearly exhibit atomically resolved images consisting of anions and cations for both conditions. The AFM image reveals that the force between tip and surface in dry argon is stronger than that in air.

引用

页码：4752 / 4753

页数：2

共 7 条

[1] INVESTIGATION OF THE (001) CLEAVAGE PLANE OF POTASSIUM-BROMIDE WITH AN ATOMIC FORCE MICROSCOPE AT 4.2-K IN ULTRA-HIGH VACUUM [J].