OPTICAL-BEAM-DEFLECTION ATOMIC FORCE MICROSCOPY - THE NACL (001) SURFACE

被引：233

作者：

MEYER, G ^{[1
]}

AMER, NM ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 21期

关键词：

D O I：

10.1063/1.102985

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have imaged, in ultrahigh vacuum, the (001) surface of NaCl using an optical-beam-deflectin force microscope operating in the short-range repulsive regime. The design and performance characteristics of the microscope are given, and the observed atomic corrugations are compared with those deduced from He-atom scattering experiments.

引用

页码：2100 / 2101

页数：2

共 9 条

[1] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].