EFFECT OF PRIMARY BEAM ENERGY ON THE SECONDARY ION SPUTTERING EFFICIENCY OF LIQUID SECONDARY IONIZATION MASS-SPECTROMETRY IN THE 5-30-KEV RANGE

被引：26

作者：

ABERTH, WH

BURLINGAME, AL

机构：

来源：

ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 14期

关键词：

D O I：

10.1021/ac00165a016

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：1426 / 1428

页数：3

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