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BIAS-DEPENDENT PHOTO-LUMINESCENCE INTENSITIES IN N-INP SCHOTTKY DIODES
被引:22
作者
:
ANDO, K
论文数:
0
引用数:
0
h-index:
0
ANDO, K
YAMAMOTO, A
论文数:
0
引用数:
0
h-index:
0
YAMAMOTO, A
YAMAGUCHI, M
论文数:
0
引用数:
0
h-index:
0
YAMAGUCHI, M
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1980年
/ 51卷
/ 12期
关键词
:
D O I
:
10.1063/1.327595
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:6432 / 6434
页数:3
相关论文
共 5 条
[1]
EVIDENCE FOR LOW SURFACE RECOMBINATION VELOCITY ON N-TYPE INP
CASEY, HC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CASEY, HC
BUEHLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUEHLER, E
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(05)
: 247
-
249
[2]
ELECTROREFLECTANCE OF SI-MOS
MISAWA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
MISAWA, K
MORITANI, A
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
MORITANI, A
NAKAI, J
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
NAKAI, J
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1976,
15
(07)
: 1309
-
1316
[3]
WINOGRADOFF NN, 1965, PHYS REV, V138, P1562
[4]
MEASUREMENT OF DIFFUSION LENGTHS IN DIRECT-GAP SEMICONDUCTORS BY ELECTRON-BEAM EXCITATION
WITTRY, DB
论文数:
0
引用数:
0
h-index:
0
WITTRY, DB
KYSER, DF
论文数:
0
引用数:
0
h-index:
0
KYSER, DF
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(01)
: 375
-
&
[5]
1973, ELECTRONIC PROPERTIE, P21
←
1
→
共 5 条
[1]
EVIDENCE FOR LOW SURFACE RECOMBINATION VELOCITY ON N-TYPE INP
CASEY, HC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CASEY, HC
BUEHLER, E
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BUEHLER, E
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(05)
: 247
-
249
[2]
ELECTROREFLECTANCE OF SI-MOS
MISAWA, K
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
MISAWA, K
MORITANI, A
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
MORITANI, A
NAKAI, J
论文数:
0
引用数:
0
h-index:
0
机构:
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
OSAKA UNIV, FAC ENGN, DEPT ELECTR, SUITA 565, OSAKA, JAPAN
NAKAI, J
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1976,
15
(07)
: 1309
-
1316
[3]
WINOGRADOFF NN, 1965, PHYS REV, V138, P1562
[4]
MEASUREMENT OF DIFFUSION LENGTHS IN DIRECT-GAP SEMICONDUCTORS BY ELECTRON-BEAM EXCITATION
WITTRY, DB
论文数:
0
引用数:
0
h-index:
0
WITTRY, DB
KYSER, DF
论文数:
0
引用数:
0
h-index:
0
KYSER, DF
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(01)
: 375
-
&
[5]
1973, ELECTRONIC PROPERTIE, P21
←
1
→