MICROMAGNETIC TRACK PROFILE ASYMMETRIES IN DUAL MAGNETORESISTIVE HEADS

被引：19

作者：

NIX, L

HELMS, C

OCONNOR, D

机构：

[1] Thin Film Disk Head Development, Storage Technology Corporation, Louisville, Colorado

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 06期

关键词：

D O I：

10.1109/20.278918

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An approximate 3-D micromagnetic model of a shielded, finite stripe height, dual element Magnetoresistive head is developed. It is shown that asymmetric bias profiles in the cross track direction arise from uniform bias magnetic fields. These asymmetric bias profiles appear in addition to the previously reported anisotropic signal flux propagation that occurs with respect to MR sensor width edges. In addition, DELTA-theta contours and track profile response curves that arise due to simulated recorded magnetization signal fields are presented.

引用

页码：4693 / 4697

页数：5