TE DOPING STUDY IN MOLECULAR-BEAM EPITAXIAL-GROWTH OF GASB USING SB2TE3

被引:27
作者
CHIU, TH [1 ]
DITZENBERGER, JA [1 ]
LUFTMAN, HS [1 ]
TSANG, WT [1 ]
HA, NT [1 ]
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
关键词
D O I
10.1063/1.103118
中图分类号
O59 [应用物理学];
学科分类号
摘要
Te evaporated from a Sb2Te3 compound source has been used to dope GaSb grown by molecular beam epitaxy. Te concentrations up to 2×1019 cm-3 followed a simple Arrhenius behavior with respect to source temperature. Efficient incorporation of Te remained insensitive to growth temperature until above 540 °C. Carrier density was found very close to Te doping level up to about 2×1018 cm -3. Above that, electron mobility as well as crystallinity deteriorated with increasing Te concentration. A dependence of surface reconstruction on Te doping level was observed. A complete change from (1×3) to (2×1) pattern occurred when Te concentration considerably exceeded its solubility limit in GaSb.
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页码:1688 / 1690
页数:3
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