CAVITY PERTURBATION METHOD FOR MEASUREMENT OF PERMITTIVITY AND CONDUCTIVITY OF MEDIUM LOSSY SEMICONDUCTORS AND DIELECTRICS

被引：6

作者：

CICMANEC, P

机构：

来源：

关键词：

D O I：

10.1016/0038-1101(71)90090-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：153 / &

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