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DIAMETER MEASUREMENT OF SMALL FIBERS - LASER DIFFRACTION AND SCANNING ELECTRON-MICROSCOPY TECHNIQUE RESULTS DO NOT DIFFER SYSTEMATICALLY
被引:19
作者
:
MERETZ, S
论文数:
0
引用数:
0
h-index:
0
机构:
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
MERETZ, S
LINKE, T
论文数:
0
引用数:
0
h-index:
0
机构:
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
LINKE, T
SCHULZ, E
论文数:
0
引用数:
0
h-index:
0
机构:
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
SCHULZ, E
HAMPE, A
论文数:
0
引用数:
0
h-index:
0
机构:
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
HAMPE, A
HENTSCHEL, M
论文数:
0
引用数:
0
h-index:
0
机构:
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
HENTSCHEL, M
机构
:
[1]
Federal Institute for Materials Research and Testing (BAM), Berlin 45, D-1000
来源
:
JOURNAL OF MATERIALS SCIENCE LETTERS
|
1992年
/ 11卷
/ 21期
关键词
:
D O I
:
10.1007/BF00729668
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
[No abstract available]
引用
收藏
页码:1471 / 1472
页数:2
相关论文
共 2 条
[1]
HAEGE R, 1988, FIBRE REINFORCEMENT, V2, P479
[2]
IMPROVED ACCURACY OF THE LASER DIFFRACTION TECHNIQUE FOR DIAMETER MEASUREMENT OF SMALL FIBERS
[J].
LI, CT
论文数:
0
引用数:
0
h-index:
0
机构:
Dow Corning Corporation, Midland, 48686, Michigan
LI, CT
;
TIETZ, JV
论文数:
0
引用数:
0
h-index:
0
机构:
Dow Corning Corporation, Midland, 48686, Michigan
TIETZ, JV
.
JOURNAL OF MATERIALS SCIENCE,
1990,
25
(11)
:4694
-4698
←
1
→
共 2 条
[1]
HAEGE R, 1988, FIBRE REINFORCEMENT, V2, P479
[2]
IMPROVED ACCURACY OF THE LASER DIFFRACTION TECHNIQUE FOR DIAMETER MEASUREMENT OF SMALL FIBERS
[J].
LI, CT
论文数:
0
引用数:
0
h-index:
0
机构:
Dow Corning Corporation, Midland, 48686, Michigan
LI, CT
;
TIETZ, JV
论文数:
0
引用数:
0
h-index:
0
机构:
Dow Corning Corporation, Midland, 48686, Michigan
TIETZ, JV
.
JOURNAL OF MATERIALS SCIENCE,
1990,
25
(11)
:4694
-4698
←
1
→