BULK AND MICROPROBE ANALYSIS FOR TRACE-ELEMENTS WITH SYNCHROTRON RADIATION

被引：7

作者：

LENGLET, WJM

VIS, RD

VANLANGEVELDE, F

VERHEUL, H

机构：

来源：

ANALYTICA CHIMICA ACTA | 1987年 / 195卷

关键词：

D O I：

10.1016/S0003-2670(00)85657-3

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：153 / 162

页数：10

共 10 条

[1]

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[2] EXPERIMENTAL COMPARISON OF SYNCHROTRON RADIATION WITH OTHER MODES OF EXCITATION OF X-RAYS FOR TRACE-ELEMENT ANALYSIS [J].

BOS, AJJ ;

VIS, RD ;

VERHEUL, H ;

PRINS, M ;

DAVIES, ST ;

BOWEN, DK ;

MAKJANIC, J ;

VALKOVIC, V .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :232-240

[3]

FENYVES E, 1969, PHYSICAL PRINCIPLES, P29

[4] SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS BY SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE [J].

GORDON, BM .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 204 (01) :223-229

[5]

HEITLER W, 1954, QUANTUM PHYSICS RAD

[6]

Hubbell J. H., 1975, Journal of Physical and Chemical Reference Data, V4, P471, DOI 10.1063/1.555523

[7]

SPARKS CJ, 1980, SYNCHROTRON RAD RES, pCH14

[8]

VANLANGEVELDE F, 1987, IN PRESS NUCL INST A

[9]

VIS RD, 1980, NUCLEAR STRUCTURE, P407

[10]

VIS RD, 1985, PROTON MICROPROBE

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