MICROCIRCUIT ACCELERATED TESTING USING HIGH-TEMPERATURE OPERATING TESTS

被引：15

作者：

STITCH, M

JOHNSON, GM

KIRK, BP

BRAUER, JB

机构：

[1] MCDONNELL DOUGLAS ASTRONAUT E,DEPT E261,POB 516,ST LOUIS,MO 63166

[2] USAF,ROME AIR DEV CTR,CODE RBRM,GRIFFISS AFB,NY 13441

来源：

关键词：

D O I：

10.1109/TR.1975.5215180

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：238 / 250

页数：13

共 12 条

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[2]

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[3]

HOEL PG, 1971, INTRO MATH STATISTIC, P324

[4]

JOHNSON GM, 1974, JUN GOV MICR APPL C

[5]

LYNN R, 1961, IRE NSRQCE C, P208

[6]

NATRELLA MG, 1963, EXPTL STATISTICS

[7]

PECK DS, 1974, P IEEE, V62, P185, DOI 10.1109/PROC.1974.9408

[8]

PECK DS, 1971, 9TH P ANN REL PHYS S, P68

[9] THERMALLY ACCELERATED AGING OF SEMICONDUCTOR COMPONENTS [J].

REYNOLDS, FH .

[10]

SMITH JS, 1967, 6 P ANN REL PHYS S L, P1