ANALYSIS OF THE 3-DIMENSIONAL ELECTRON-DISTRIBUTION IN SILICON USING DIRECTIONAL COMPTON PROFILE MEASUREMENTS

被引:36
作者
HANSEN, NK [1 ]
PATTISON, P [1 ]
SCHNEIDER, JR [1 ]
机构
[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH, D-1000 BERLIN 39, FED REP GER
来源
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1987年 / 66卷 / 03期
关键词
D O I
10.1007/BF01305420
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:305 / 315
页数:11
相关论文
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