SPECTRAL ANALYZER FOR THOMSON SCATTERING

被引：8

作者：

DESILVA, AW ^{[1
]}

机构：

[1] ECOLE POLYTECH FED LAUSANNE, CTR RECH PHYS PLASMAS, CH-1007 LAUSANNE, SWITZERLAND

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1979年 / 50卷 / 12期

关键词：

D O I：

10.1063/1.1135775

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe here a four-channel spectral analyzer suitable for use in Thomson scattering diagnostics of plasmas, that incorporates several novel features and is inexpensive and physically compact. It is suitable for spectral analysis of light scattered from plasmas having densities down to ∼10 14 cm-3 and temperatures up to several hundred electron volts.

引用

页码：1605 / 1608

页数：4

共 10 条

[1] NOISE AND IONIZATION RATE MEASUREMENTS IN SILICON PHOTODIODES [J].

BAERTSCH, RD .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (12) :987-&

[2] LOW-FREQUENCY NOISE MEASUREMENTS IN SILICON AVALANCHE PHOTODIODES [J].

BAERTSCH, RD .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (03) :383-+

[3]

DESILVA AW, 1971, METHODS EXPT PHYSI B, V9

[4]

DOBELE HF, 1978, PLASMA PHYS CONTR F, V20, P241, DOI 10.1088/0032-1028/20/3/007

[5] AVALANCHE CHARACTERISTICS AND FAILURE MECHANISM OF HIGH VOLTAGE DIODES [J].

EGAWA, H .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (11) :754-+

[6] FREQUENCY RESPONSE OF AVALANCHING PHOTODIODES [J].

EMMONS, RB ;

LUCOVSKY, G .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (03) :297-+

[7] NOISE AND FREQUENCY-RESPONSE OF SILICON PHOTODIODE OPERATIONAL AMPLIFIER COMBINATION [J].

HAMSTRA, RH ;

WENDLAND, P .

APPLIED OPTICS, 1972, 11 (07) :1539-&

[8]

Kunze H-J., 1968, PLASMA DIAGNOSITCS, ppp 550

[9] MULTIPLICATION NOISE IN UNIFORM AVALANCHE DIODES [J].

MCINTYRE, RJ .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (01) :164-+

[10] NOISE LIMITATIONS IN SOLID STATE PHOTODETECTORS [J].

VANVLIET, KM .

APPLIED OPTICS, 1967, 6 (07) :1145-&

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