ELECTROLUMINESCENCE EFFICIENCY PROFILES OF MN IN ZNS AC THIN-FILM ELECTROLUMINESCENCE DEVICES

被引：17

作者：

MARRELLO, V

ONTON, A

机构：

[1] IBM Research Laboratory, San Jose

来源：

APPLIED PHYSICS LETTERS | 1979年 / 34卷 / 08期

关键词：

D O I：

10.1063/1.90851

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report a direct measurement of relative Mn electroluminescence (EL) efficiency in an ac EL device as a function of position normal to the ZnS film plane. The Mn EL efficiency decreases strongly with distance from the cathodic to anodic region of the ZnS layer. The cathodic-to-anodic efficiency ratio is about two orders of magnitude. In addition, the first ∼0.2 μm of ZnS deposited exhibits a significantly lower Mn EL efficiency relative to the remaining ZnS.

引用

页码：525 / 527

页数：3

共 7 条

[1] CUSANO DA, 1962, LUMINESCENCE ORGANIC, P464
[2] A THEORY OF SENSITIZED LUMINESCENCE IN SOLIDS
DEXTER, DL
[J]. JOURNAL OF CHEMICAL PHYSICS, 1953, 21 (05) : 836 - 850
[3] LAWTHER C, 1977, PHYS STATUS SOLIDI A, V44, P313, DOI 10.1002/pssa.2210440133
[4] MEMORY EFFECT OF ZNS-MN AC THIN-FILM ELECTROLUMINESCENCE
MARRELLO, V
RUHLE, W
ONTON, A
[J]. APPLIED PHYSICS LETTERS, 1977, 31 (07) : 452 - 454
[5] PIPER WW, 1958, SOLID STATE PHYS, V6, P96
[6] EVIDENCE FOR DIRECT IMPACT EXCITATION OF MN CENTERS IN ELECTROLUMINESCENT ZNS-MN FILMS
TANAKA, S
KOBAYASHI, H
SASAKURA, H
HAMAKAWA, Y
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (12) : 5391 - 5393
[7] VLASENKO NA, 1965, OPT SPECTROSC-USSR, V18, P263

← 1 →