DIFFRACTION CONTRAST RETAINED BY PLASMON AND K-LOSS ELECTRONS

被引:33
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ROSSOUW, CJ
WHELAN, MJ
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10.1016/S0304-3991(81)80177-5
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TH742 [显微镜];
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页码:53 / 66
页数:14
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[21]  
REZ P, 1976, THESIS U OXFORD
[22]   ORIENTATION DEPENDENCE OF MEASURED INELASTIC-SCATTERING PROBABILITIES FOR FAST ELECTRONS IN SINGLE-CRYSTALS [J].
ROSSOUW, CJ ;
WHELAN, MJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (09) :1521-+
[23]   Kikuchi Patterns in a High Voltage Electron Microscope [J].
Thomas, L. E. ;
Humphreys, C. J. .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1970, 3 (03) :599-615
[24]   SIKUCHI PATTERNS IN HIGH-VOLTAGE ELECTRON-MICROSCOPY [J].
THOMAS, LE .
PHILOSOPHICAL MAGAZINE, 1972, 26 (06) :1447-&
[25]   INELASTIC SCATTERING OF FAST ELECTRONS BY CRYSTALS .I. INTERBAND EXCITATIONS [J].
WHELAN, MJ .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (07) :2099-&
[26]   RESONANCE ERRORS AND PARTIAL COHERENCE IN INELASTIC-SCATTERING OF FAST ELECTRONS BY CRYSTAL EXCITATIONS [J].
YOUNG, AP ;
REZ, P .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1975, 8 (01) :L1-L7