REFLECTION X-RAY TOPOGRAPHY OF GAAS AND GAP CLEAVAGE FACES

[1] HABERECHT RR, 1969, SEMICONDUCTOR SILICO, P585

[2] COMPOSITIONAL X-RAY TOPOGRAPHY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (06) : 567 - &

[3] HOWARD JK, 1966, ADVAN XRAY ANAL, V9, P35

[4] MEIERAN ES, 1968, T METALL SOC AIME, V242, P413

[5] MEIERAN ES, 1970, SIEMENS REV, V37, P1

[6] PRUNIANX BR, TO BE PUBLISHED

[7] ROZGONYI GA, 1970, OCT ATL CIT M SOC

[8] DEVELOPMENT OF A METHOD IN X-RAY REFLEXION TOPOGRAPHY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 223 - &

[9] OPTICAL OBSERVATION OF MISMATCH DISLOCATIONS IN GAAS LUMINESCENT DIODES [J]. SOLID STATE COMMUNICATIONS, 1969, 7 (02) : 335 - &

[1] HABERECHT RR, 1969, SEMICONDUCTOR SILICO, P585

[2] COMPOSITIONAL X-RAY TOPOGRAPHY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (06) : 567 - &

[3] HOWARD JK, 1966, ADVAN XRAY ANAL, V9, P35

[4] MEIERAN ES, 1968, T METALL SOC AIME, V242, P413

[5] MEIERAN ES, 1970, SIEMENS REV, V37, P1

[6] PRUNIANX BR, TO BE PUBLISHED

[7] ROZGONYI GA, 1970, OCT ATL CIT M SOC

[8] DEVELOPMENT OF A METHOD IN X-RAY REFLEXION TOPOGRAPHY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 223 - &

[9] OPTICAL OBSERVATION OF MISMATCH DISLOCATIONS IN GAAS LUMINESCENT DIODES [J]. SOLID STATE COMMUNICATIONS, 1969, 7 (02) : 335 - &