MICROWAVE-BIASED MILLIMETER-WAVE AND SUBMILLIMETER-WAVE DETECTOR USING INSB

被引：10

作者：

ELDUMIAT.II

HADDAD, GI

机构：

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1972年 / ED19卷 / 02期

关键词：

D O I：

10.1109/T-ED.1972.17405

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：257 / +

页数：1

共 28 条

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[3]

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[4] CAVITY PERTURBATION TECHNIQUES FOR MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT OF A BULK SEMICONDUCTOR MATERIAL [J].

ELDUMIATI, II ;

HADDAD, GI .

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[5]

ELDUMIATI II, 1970, 118 U MICH EL PHYS L

[6]

GIGGEY GF, 1964, PHOTOELECTRIC MILLIM

[7] DETECTION OF MILLIMETRE AND SUB-MILLIMETRE WAVE RADIATION BY FREE CARRIER ABSORPTION IN A SEMICONDUCTOR [J].

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ROLLIN, BV .

BRITISH JOURNAL OF APPLIED PHYSICS, 1963, 14 (10) :672-&

[8]

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[9]

KRUMM CF, 1970, 116 U MICH EL PHYS L

[10] LOW-TEMPERATURE GERMANIUM BOLOMETER [J].

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