COMPARISON OF AN AMORPHOUS CBS STRUCTURE MODEL OF AMORPHOUS SILICON WITH X-RAY AND ELECTRON-SCATTERING DATA

被引：1

作者：

BOYCE, JF ^{[1
]}

MCCLOUGH.JK ^{[1
]}

机构：

[1] UNIV LONDON,QUEEN ELIZABETH COLL,PHYS DEPT,LONDON,ENGLAND

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1974年 / 63卷 / 02期

关键词：

D O I：

10.1002/pssb.2220630218

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：569 / 575

页数：7

共 17 条

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