THE EFFECTS OF ABRASION GETTERING ON SILICON MATERIAL WITH SWIRL DEFECTS

被引：7

作者：

REED, CL

MAR, KM

机构：

来源：

关键词：

D O I：

10.1149/1.2130066

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：2058 / 2062

页数：5

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