ANALYSIS ON YIELD OF INTEGRATED-CIRCUITS AND A NEW EXPRESSION FOR YIELD

被引：36

作者：

OKABE, T ^{[1
]}

NAGATA, M ^{[1
]}

SHIMADA, S ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LAB,TOKYO,JAPAN

来源：

关键词：

D O I：

10.1002/eej.4390920619

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：135 / 141

页数：7

共 14 条

[1] ANSLEY WG, 1968, IEEE T ELECTRON DEVI, VED15, P405
[2] MIMURA, 1970, JOINT CONV REC 4 ELE, P1702
[3] MOORE GE, 1970, ELECTRONICS, V43, P126
[4] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS
MURPHY, BT
[J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &
[5] NEW LOOK AT YIELD OF INTEGRATED CIRCUITS
MURPHY, BT
[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (07): : 1128 - &
[6] NOYCE RN, 1968, ISSCC KEYNOTE ADDRES
[7] NOYCE RN, 1970, MAGAZINE ELECTRO JUL, P13
[8] OKABE T, 1972, DENKI GAKKAI RONBU C, V92, P399
[9] OKABE T, 1971, NATL CONV RECORD IEC, P926
[10] PETRITZ RL, 1968, IEEE J SOLID STATE C, VSC 2, P130