SURFACE-TEMPERATURE MEASUREMENT OF DIELECTRIC MATERIALS HEATED BY PULSED LASER-RADIATION

[1] EFFECTS OF LASER-PULSE CHARACTERISTICS AND THERMAL-DESORPTION PARAMETERS ON LASER-INDUCED THERMAL-DESORPTION [J]. SURFACE SCIENCE, 1986, 167 (2-3) : 341 - 362

[2] CALCULATIONS OF THE SURFACE-TEMPERATURE RISE AND DESORPTION TEMPERATURE IN LASER-INDUCED THERMAL-DESORPTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1362 - 1366

[3] Chopra K.L, 1969, THIN FILM PHENOMENA

[4] PYROELECTRIC CALORIMETER FOR PHOTOTHERMAL STUDIES OF THIN-FILMS AND ADSORBATES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (05): : 2875 - 2889

[5] Dlugunovich V. A., 1978, Zhurnal Prikladnoi Spektroskopii, V28, P233

[6] HALL RB, 1986, CHEM STRUCTURE INTER

[7] THIN-FILM CONDUCTING AND SEMICONDUCTING RESISTANCE THERMOMETERS FOR SURFACE-TEMPERATURE MEASUREMENT [J]. JOURNAL OF ENGINEERING FOR POWER-TRANSACTIONS OF THE ASME, 1977, 99 (03): : 385 - 390

[8] PULSED LASER PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY FOR SURFACE STUDIES [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 38 (01): : 19 - 21

[9] ELECTRICAL CONDUCTION MECHANISM IN ULTRATHIN, EVAPORATED METAL FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) : 74 - &

[10] Palik E. D., 1985, HDB OPTICAL CONSTANT

[1] EFFECTS OF LASER-PULSE CHARACTERISTICS AND THERMAL-DESORPTION PARAMETERS ON LASER-INDUCED THERMAL-DESORPTION [J]. SURFACE SCIENCE, 1986, 167 (2-3) : 341 - 362

[2] CALCULATIONS OF THE SURFACE-TEMPERATURE RISE AND DESORPTION TEMPERATURE IN LASER-INDUCED THERMAL-DESORPTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1362 - 1366

[3] Chopra K.L, 1969, THIN FILM PHENOMENA

[4] PYROELECTRIC CALORIMETER FOR PHOTOTHERMAL STUDIES OF THIN-FILMS AND ADSORBATES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (05): : 2875 - 2889

[5] Dlugunovich V. A., 1978, Zhurnal Prikladnoi Spektroskopii, V28, P233

[6] HALL RB, 1986, CHEM STRUCTURE INTER

[7] THIN-FILM CONDUCTING AND SEMICONDUCTING RESISTANCE THERMOMETERS FOR SURFACE-TEMPERATURE MEASUREMENT [J]. JOURNAL OF ENGINEERING FOR POWER-TRANSACTIONS OF THE ASME, 1977, 99 (03): : 385 - 390

[8] PULSED LASER PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY FOR SURFACE STUDIES [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1985, 38 (01): : 19 - 21

[9] ELECTRICAL CONDUCTION MECHANISM IN ULTRATHIN, EVAPORATED METAL FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (01) : 74 - &

[10] Palik E. D., 1985, HDB OPTICAL CONSTANT