X-RAY TOPOGRAPHY WITH CHROMATIC-ABERRATION CORRECTION

被引:3
作者
CHIKAWA, J
FUJIMOTO, I
ASAEDA, Y
机构
关键词
D O I
10.1063/1.1659847
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:4731 / &
相关论文
共 9 条
[1]  
BARRETT CS, 1945, T AM I MIN MET ENG, V161, P15
[2]  
CHIKAWA J, 1967, ADV XRAY ANAL, V10, P153
[4]   X-RAY DIFFRACTION TOPOGRAPHY UTILIZING DOUBLE-CRYSTAL ARRANGEMENT OF (+, +) OR NON-PARALLEL (+, -) SETTING [J].
KOHRA, K ;
HASHIZUME, H ;
YOSHIMURA, J .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (09) :1029-+
[5]   A NEW METHOD OF X-RAY DIFFRACTION TOPOGRAPHY USING MONOCHROMATIC DIVERGENT BEAMS MADE BY A CURVED CRYSTAL [J].
KOHRA, K ;
TAKANO, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1968, 7 (09) :982-&
[6]   THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].
LANG, AR .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (03) :249-250
[8]  
NEWKIRK JB, 1959, T AM I MIN MET ENG, V215, P483