DIELECTRIC MEASUREMENTS OF SELECTED CERAMIC MATERIALS AT 245 GHZ

被引：7

作者：

DUTTA, JM

JONES, CR

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 09期

关键词：

D O I：

10.1063/1.341250

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4674 / 4677

页数：4

共 13 条

[1] MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS [J].

AFSAR, MN ;

BUTTON, KJ .

PROCEEDINGS OF THE IEEE, 1985, 73 (01) :131-153

[2]

Bell EE, 1967, HDB PHYSIK, VXXV, P1

[3] COMPLEX DIELECTRIC-CONSTANTS FOR SELECTED NEAR-MILLIMETER-WAVE MATERIALS AT 245-GHZ [J].

DUTTA, JM ;

JONES, CR ;

DAVE, H .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1986, 34 (09) :932-936

[4]

FOWLES GR, 1975, INTRO MODERN OPTICS, P68

[5]

HO WW, SC53572TR ROCKW INT

[6] 2-BEAM INTERFEROMETER FOR OPTICAL-CONSTANTS MEASUREMENTS AT NEAR-MILLIMETER WAVELENGTHS [J].

JONES, CR ;

DUTTA, JM ;

DAVE, H .

INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1984, 5 (03) :279-299

[7] CURRENT-VOLTAGE CHARACTERISTICS OF ALUMINUM NITRIDE FILMS FORMED BY RF GLOW-DISCHARGE [J].

MANGALARAJ, D ;

RADHAKRISHNAN, M ;

BALASUBRAMANIAN, C ;

KASILINGAM, AR .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1980, 13 (06) :L101-L105

[8]

MESSIER DR, 1974, AMMRC TR7421 ARM MAT

[9]

Perry G. S., 1974, 12th Symposium on Electromagnetic Windows, P67

[10] REFRACTIVE INDICES OF GERMANIUM SILICON AND FUSED QUARTZ IN FAR INFRARED [J].

RANDALL, CM ;

RAWCLIFFE, RD .

APPLIED OPTICS, 1967, 6 (11) :1889-+

← 1 2 →