GRAIN-BOUNDARY SCATTERING IN ALUMINUM FILMS DEPOSITED ON TO CALCITE SUBSTRATE

被引：6

作者：

BANDYOPADHYAY, SK

PAL, AK

机构：

[1] Department of General Physics and X-rays, Indian Association for the Cultivation of Science, Calcutta

来源：

JOURNAL OF MATERIALS SCIENCE | 1979年 / 14卷 / 06期

关键词：

D O I：

10.1007/BF00549303

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Electrical resistivity and temperature coefficient of resistivity of polycrystalline aluminium films deposited onto calcite substrates have been measured in situ. It was observed that films deposited at 130° C substrate temperature show reversible and reproducible behaviour with thermal cycling. The grain-boundary scattering theory of Mayadas and Shatzkes reproduces the experimental observations quite faithfully with the coefficient of specular reflection p=0 and grain-boundary reflection coefficient R=0.38 indicating that the grain-boundary scattering plays a significant role in electron transport in aluminium film deposited on to calcite substrate. © 1979 Chapman and Hall Ltd.

引用

页码：1321 / 1325

页数：5

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