LARGE STRAINS IN THE EPITAXY OF CU ON PT(001)

被引：33

作者：

LI, YS ^{[1
]}

QUINN, J ^{[1
]}

LI, H ^{[1
]}

TIAN, D ^{[1
]}

JONA, F ^{[1
]}

MARCUS, PM ^{[1
]}

机构：

[1] IBM CORP,RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1991年 / 44卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.44.8261

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 15-17 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001} 1 X 1 net (a0 = 3.93 angstrom), and that the bulk interlayer spacing is 1.62 +/- 0.04 angstrom. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd {001}.

引用

页码：8261 / 8266

页数：6

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