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IMPROVEMENTS OF CYLINDRICAL TM010 CAVITY FOR AN ATMOSPHERIC-PRESSURE MICROWAVE-INDUCED PLASMA
被引:92
作者
:
VANDALEN, JPJ
论文数:
0
引用数:
0
h-index:
0
VANDALEN, JPJ
DELEZENNEGOULANDER, PA
论文数:
0
引用数:
0
h-index:
0
DELEZENNEGOULANDER, PA
DEGALAN, L
论文数:
0
引用数:
0
h-index:
0
DEGALAN, L
机构
:
来源
:
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
|
1978年
/ 33卷
/ 08期
关键词
:
D O I
:
10.1016/0584-8547(78)80061-5
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:545 / 549
页数:5
相关论文
共 5 条
[1]
CAVITY FOR MICROWAVE-INDUCED PLASMAS OPERATED IN HELIUM AND ARGON AT ATMOSPHERIC-PRESSURE
BEENAKKER, CIM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
BEENAKKER, CIM
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1976,
31
(8-9)
: 483
-
486
[2]
EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY
BEENAKKER, CIM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
BEENAKKER, CIM
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1977,
32
(3-4)
: 173
-
187
[3]
BEENAKKER CIM, 1978, SPECTROCHIM ACTA B, V33, P56
[4]
POOLE CP, 1967, ELECTRON SPIN RESONA
[5]
OPTIMIZATION OF MICROWAVE-INDUCED PLASMA AS AN ELEMENT-SELECTIVE DETECTOR FOR NON-METALS
VANDALEN, JPJ
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
VANDALEN, JPJ
DELEZENNECOULANDER, PA
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELEZENNECOULANDER, PA
DEGALAN, L
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DEGALAN, L
[J].
ANALYTICA CHIMICA ACTA,
1977,
94
(01)
: 1
-
19
←
1
→
共 5 条
[1]
CAVITY FOR MICROWAVE-INDUCED PLASMAS OPERATED IN HELIUM AND ARGON AT ATMOSPHERIC-PRESSURE
BEENAKKER, CIM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
BEENAKKER, CIM
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1976,
31
(8-9)
: 483
-
486
[2]
EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY
BEENAKKER, CIM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
BEENAKKER, CIM
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1977,
32
(3-4)
: 173
-
187
[3]
BEENAKKER CIM, 1978, SPECTROCHIM ACTA B, V33, P56
[4]
POOLE CP, 1967, ELECTRON SPIN RESONA
[5]
OPTIMIZATION OF MICROWAVE-INDUCED PLASMA AS AN ELEMENT-SELECTIVE DETECTOR FOR NON-METALS
VANDALEN, JPJ
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
VANDALEN, JPJ
DELEZENNECOULANDER, PA
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELEZENNECOULANDER, PA
DEGALAN, L
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DELFT UNIV TECHNOL,ANALYT SCHEIKUNDE LAB,DELFT,NETHERLANDS
DEGALAN, L
[J].
ANALYTICA CHIMICA ACTA,
1977,
94
(01)
: 1
-
19
←
1
→