DEFECT PROCESSES IN GAP - IMPLICATIONS FOR THE BEHAVIOR OF EXCITED SURFACE-DEFECTS

被引:10
作者
KHOO, GS
ONG, CK
机构
[1] Department of Physics, Faculty of Science, National University of Singapore
来源
PHYSICAL REVIEW B | 1993年 / 47卷 / 15期
关键词
D O I
10.1103/PhysRevB.47.9346
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the different charge states and geometries of the P vacancy and Ga antisite defects in bulk GaP as well as on the GaP(110) surface. Similar behavior is observed for both the bulk and surface. The charged P vacancy V(P)+ exhibits symmetric outward relaxations from the vacancy site while V(P)0 and V(P)- display distortions that lower the symmetry. For the Ga antisite defect (Ga(P)), the neutral Ga(P)0 has a broken-bond configuration with one of its Ga nearest neighbors, while Ga(P)- and Ga(P)2- both have the centered configuration. However, due to their lack of symmetry, the atoms at the surface display a larger distortion. The effects of excitations initially lead to a more positive charge state of the surface defects and subsequently to bond weakening.
引用
收藏
页码:9346 / 9349
页数:4
相关论文
共 36 条
[1]   NEGATIVE-U CHARACTER OF THE ADSORPTION ON SEMICONDUCTOR SURFACES - APPLICATION TO METALS ON GAAS(110) [J].
ALLAN, G ;
LANNOO, M .
PHYSICAL REVIEW LETTERS, 1991, 66 (09) :1209-1211
[2]   MODEL FOR ELECTRONIC-STRUCTURE OF AMORPHOUS-SEMICONDUCTORS [J].
ANDERSON, PW .
PHYSICAL REVIEW LETTERS, 1975, 34 (15) :953-955
[3]  
[Anonymous], 1970, APPROXIMATE MOL ORBI
[4]  
BARAFF GA, 1980, PHYS REV B, V21, P3583
[5]  
BETZ G, 1990, P DIET 4 WORKSHOP
[6]   NEW MECHANISM FOR INTERSTITIAL MIGRATION [J].
BOURGOIN, JC ;
CORBETT, JW .
PHYSICS LETTERS A, 1972, A 38 (02) :135-&
[7]  
BRENIG W, 1985, P DIET 2 WORKSHOP
[8]   ELECTRONIC-STRUCTURE AND ELECTRON-PARAMAGNETIC-RESONANCE PROPERTIES OF INTRINSIC DEFECTS IN GAAS [J].
DELERUE, C .
PHYSICAL REVIEW B, 1991, 44 (19) :10525-10535
[9]   THEORY OF THE PB CENTER AT THE [111] SI/SIO2 INTERFACE [J].
EDWARDS, AH .
PHYSICAL REVIEW B, 1987, 36 (18) :9638-9648
[10]  
FIGIELSKI T, 1988, 8TH P INT SCH DEF CR, P379