PICOSECOND TIME-RESOLVED REFLECTIVITY OF POROUS SILICON

被引:5
作者
BUGAYEV, AA
KHAKHAEV, IA
ZUBRILOV, AS
机构
[1] Ioffe Physical and Technical Institute
关键词
D O I
10.1016/0030-4018(94)90058-2
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The nonlinear optical properties of porous silicon films are studied under band-to-band picosecond pulse excitation. The negative value of the reflectivity change on a picowcond time-scale is explained by the increased absorption of porous silicon as a result of free-carrier generation. This conclusion is well supported by the temporal evolution of the reflectivity spectrum where a blue shift of interference fringes is clearly observed. The origin of the rapid recombination of the charge carriers (approximately 100 ps) is attributed to the influence of either quantum confinement effects or high concentration of surface-related defects.
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页码:65 / 68
页数:4
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