THERMAL STRAIN IN LEAD THIN-FILMS .1. DEPENDENCE OF STRAIN ON CRYSTAL ORIENTATION

被引：45

作者：

MURAKAMI, M ^{[1
]}

CHAUDHARI, P ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1016/0040-6090(77)90346-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：109 / 115

页数：7

共 16 条

[1] FIRST REPORT ON DEFORMATION-MECHANISM MAPS [J].

ASHBY, MF .

ACTA METALLURGICA, 1972, 20 (07) :887-+

[2]

CARNAHAN B, 1964, APPLIED NUMERICAL ME, V1, P421

[3] LOW-TEMPERATURE PROPERTIES OF EVAPORATED LEAD FILMS [J].

CASWELL, HL ;

PRIEST, JR ;

BUDO, Y .

[4] STRAIN-RELAXATION IN THIN-FILMS ON SUBSTRATES [J].

GANGULEE, A .

ACTA METALLURGICA, 1974, 22 (02) :177-183

[5]

GRAY DE, 1972, AM I PHYSICS HDB

[6]

HARTLEY CS, 1965, T METALL SOC AIME, V233, P1415

[7]

HIRTH JP, 1968, THEORY DISLOCATIONS, P269

[8] ABSENCE OF HILLOCK FORMATION IN EPITAXIAL LEAD FILMS [J].

LAHIRI, SK .

[9]

MURAKAMI M, IN PRESS

[10]

Nye J.F., 1972, PHYSICAL PROPERTIES, P131