LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE WITH A RELIABLE PIEZOELECTRICAL COARSE APPROACH MECHANISM

被引：17

作者：

ALTFEDER, IB

VOLODIN, AP

机构：

[1] LEIDEN UNIV,KAMERLINGH ONNES LAB,2300 RA LEIDEN,NETHERLANDS

[2] KAPITZA INST PHYS PROBLEMS,117334 MOSCOW,RUSSIA

[3] MOSCOW INST STEEL & ALLOYS,MOSCOW,RUSSIA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 11期

关键词：

D O I：

10.1063/1.1144324

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The design of a compact low-temperature scanning tunneling microscope (STM) with a reliably operated piezoelectrical coarse approach system is described. The tip translation device is based on a new principle of sequential and parallel longitudinal step motions of the balanced frictional supports of the STM tip. The instrument was successfully tested in a temperature range from 0.4 to 300 K. The design is well suited for low-temperature applications.

引用

页码：3157 / 3160

页数：4

共 6 条

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